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專利授權區
專利名稱(中) 線圖型態辨識系統及方法
專利名稱(英) CHART PATTERN RECOGNITION SYSTEM AND METHOD
專利家族 中華民國:202520184(公開號)
專利權人 國立清華大學 100.00%
發明人 韓傳祥,張智星
技術領域 資訊工程
專利摘要(中)
本揭示內容係一種線圖型態辨識系統及方法,系統中的處理電路執行儲存於非揮發性記憶體中的方法包含預處理被比對線圖組以獲取以時間與空間為基礎的多個第一被比對線圖數據。標準化多個第一被比對線圖數據與來自資料庫的多個第一歷史線圖數據以獲取多個第二被比對線圖數據與多個第二歷史線圖數據。比對多個第二被比對線圖數據與多個第二歷史線圖數據以獲取多個第二被比對線圖數據與多個第二歷史線圖數據的多個相似度得分。排序多個相似度得分與對應的多個第二被比對線圖數據與多個第一歷史線圖數據。藉此,可辨識出符合型態的要求線圖。
專利摘要(英)
A chart pattern recognition system and method are provided. A processing circuit in the system executes the method stored in a non-volatile memory, including: pre-processing a chart pattern group to be compared to obtain a plurality of first chart pattern data to be compared based on time and space; normalizing the plurality of first chart pattern data to be compared and a plurality of first historical chart pattern data from a database to obtain a plurality of second chart pattern data to be compared and a plurality of second historical chart pattern data; comparing the plurality of second chart pattern data to be compared and the plurality of second historical chart pattern data to obtain multiple similarity scores between the plurality of second chart pattern data to be compared and the plurality of second historical chart pattern data; and sorting the multiple similarity scores with corresponding the plurality of second chart pattern data to be compared and the plurality of first historical chart pattern data. Thus, chart patterns that meet the requirement can be recognized.
聯絡資訊
承辦人姓名 李佳玲
承辦人電話 03-5715131 #62300
承辦人Email cl.lee@mx.nthu.edu.tw
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