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專利授權區

專利授權區
專利名稱(中)	金屬離子檢測設備及金屬離子檢測方法
專利名稱(英)	METAL ION DETECTION EQUIPMENT AND METAL ION DETECTION METHOD
專利家族	中華民國：I592651 美國：10,557,795
專利權人	國立清華大學 100%
發明人	賴建任,吳仁貴,曾繁根
技術領域	生化醫藥,光電光學

專利摘要(中)
A metal ion detection equipment and a metal ion detection method are provided. The metal ion detection equipment includes a porous silicon resonant cavity structure, an electrochemical device and a spectrum detecting device. A sample solution permeates into the porous silicon resonant cavity structure. A to-be-detected metal ion of the sample solution in the porous silicon resonant cavity structure is reduced into a to-be-detected metal by the electrochemical device. The spectrum detecting device detects a spectral variation of a reflective light from the porous silicon resonant cavity structure.

專利摘要(中)

A metal ion detection equipment and a metal ion detection method are provided. The metal ion detection equipment includes a porous silicon resonant cavity structure, an electrochemical device and a spectrum detecting device. A sample solution permeates into the porous silicon resonant cavity structure. A to-be-detected metal ion of the sample solution in the porous silicon resonant cavity structure is reduced into a to-be-detected metal by the electrochemical device. The spectrum detecting device detects a spectral variation of a reflective light from the porous silicon resonant cavity structure.

聯絡資訊
承辦人姓名	楊美茹
承辦人電話	03-5715131 #62305
承辦人Email	mjyang2@mx.nthu.edu.tw