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專利授權區

專利授權區
專利名稱(中)	具有薄層層析之拉曼檢測晶片及分離檢測分析物之方法
專利名稱(英)	Raman detecting chip for thin layer chromatography and method for separating and detecting an analyte
專利家族	中華民國：I634329 大陸：3762208 大陸：4651346 美國：10,012,625 美國：10,520,363
專利權人	國立清華大學 60.00% ,財團法人工業技術研究院 40.00%
發明人	黃致豪,嚴大任,李璧伸,林鼎晸
技術領域	材料化工,生化醫藥,光電光學

專利摘要(中)
A Raman detecting chip for thin layer chromatography and a method for separating and detecting an analyte are provided. The Raman detecting chip for thin layer chromatography includes a silicon substrate. The silicon substrate includes a first portion, a second portion and a plurality of silicon nanowires disposed on the first portion, wherein each silicon nanowire has a top surface and a sidewall. A metal layer covers the top surface and at least a part of the sidewall of the silicon nanowire, wherein the silicon nanowire has a length L from 5μm to 15μm. The ratio between the length L1 of the side wall covered by the metal layer and the length L of the silicon nanowire is from 0.2 to 0.8.

專利摘要(中)

A Raman detecting chip for thin layer chromatography and a method for separating and detecting an analyte are provided. The Raman detecting chip for thin layer chromatography includes a silicon substrate. The silicon substrate includes a first portion, a second portion and a plurality of silicon nanowires disposed on the first portion, wherein each silicon nanowire has a top surface and a sidewall. A metal layer covers the top surface and at least a part of the sidewall of the silicon nanowire, wherein the silicon nanowire has a length L from 5μm to 15μm. The ratio between the length L1 of the side wall covered by the metal layer and the length L of the silicon nanowire is from 0.2 to 0.8.

聯絡資訊
承辦人姓名	楊美茹
承辦人電話	03-5715131 #62305
承辦人Email	mjyang2@mx.nthu.edu.tw