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專利授權區
專利名稱(中) 光學探針裝置
專利名稱(英) OPTICAL PROBING INSTRUMENT
專利家族 中華民國:I730571
專利權人 國立清華大學 100.00%
發明人 李明昌
技術領域 通信傳輸,光電光學
專利摘要(中)
一種光學探針裝置,用以端面耦光積體光學元件之光訊號。光學探針裝置包含一探針卡、複數探針頭以及複數極化選擇器。探針頭設置於探針卡之一端,探針頭包含一極化區分器及二波導,二波導連接極化區分器,且穿設於探針卡,其中,各探針頭之一波導用以傳輸垂直極化光,另一波導用以傳輸水平極化光。複數極化選擇器設置於探針卡,且各極化選擇器分別連接於各探針頭之一波導。其中,各極化選擇器控制光訊號之極化方向。藉此,利用光學探針裝置可由端面耦光積體光學元件,且有較高的耦光效率,並可分析積體光學元件中常見到極化相依的問題。
專利摘要(英)
An optical probing instrument is for coupling light through an optical signal on an edge of an integrated photonic component. The optical probing instrument includes a probe card, a plurality of probe heads and a plurality of polarization selectors. The probe heads are disposed on a side of the probe card. Each of the probe heads includes a polarization discriminator and two waveguides. The waveguides are connected to the polarization discriminator and disposed through the probe card, wherein one waveguide of each of the probe heads can transmit an S-polarized light, and the other waveguide transmits a P-polarized light. The polarization selectors are disposed on the probe card and each of the polarization selectors is respectively connected to the waveguide of each of the probe heads, wherein each of the polarization selectors controls a polarization of the optical signal. Therefore, the optical probing instrument can be used to couple light through the edge of the integrated photonic component, and it has higher coupling efficiency and can analyze a polarization dependency commonly found in integrated photonic components.
聯絡資訊
承辦人姓名 李曉琪
承辦人電話 03-5715131 #31061
承辦人Email hsiaochi@mx.nthu.edu.tw
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