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專利授權區
專利名稱(中) 基於影像尺的定位量測系統
專利名稱(英) POSITIONING AND MEASURING SYSTEM BASED ON IMAGE SCALE
專利家族 中華民國:I628415
大陸:4656862
美國:10,535,157
專利權人 國立清華大學 100%
發明人 吳佑鎮,潘威丞,蔡宏營
技術領域 機械結構,資訊工程,光電光學
專利摘要(中)
A positioning and measuring system includes: an image scale supporting an object and having positioning mark sets and encoding pattern sets arranged in a two-dimensional array, each of the positioning mark sets including positioning marks, each of the encoding pattern sets including encoding patterns respectively disposed in gaps between the positioning marks; an image capturing device capturing measurement points of the object and an image scale to obtain composite images; a processor processing the composite images and determining one or multiple position relationships between the measurement points according to the encoding patterns and the positioning marks; and a driving mechanism, which is electrically connected to the processor and mechanically connected to the image capturing device or the image scale, and drives one of the image capturing device and the image scale to move relatively to the other of the image capturing device and the image scale.
聯絡資訊
承辦人姓名 劉千綺
承辦人電話 03-571-5131 #31181
承辦人Email chienchi@mx.nthu.edu.tw
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