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專利授權區
專利名稱(中) 量測介電常數之系統及方法
專利名稱(英) SYSTEM AND METHOD FOR MEASURING PERMITTIVITY
專利家族 中華民國:I546543
美國:9,810,645
專利權人 國立清華大學 100%
發明人 趙賢文,張存續,翁唯軒
技術領域 材料化工,機械結構,電子電機
專利摘要(中)
A system for measuring a permittivity includes a resonant chamber, a conductive probe, a platform, a pillar, a detector, and a computing module. The resonant chamber has a cavity. The conductive probe is configured for introducing a microwave into the cavity of the resonant chamber. The platform is configured for carrying a sample. The pillar is positioned between the platform and a chamber wall, so that the platform protrudes from the chamber wall. The detector is used to detect a resonant frequency of the microwave when resonance occurs within the cavity. The computing module is configured for calculating a permittivity corresponding to the measured resonant frequency according to a corresponding relationship between resonant frequency and permittivity. The above-mentioned system for measuring a permittivity is capable of measuring a broader range of permittivity with simplified measurement steps and higher accuracy. A method for measuring a permittivity is also disclosed.
聯絡資訊
承辦人姓名 周家鳳
承辦人電話 03-5715131 #34576
承辦人Email cf.chou@mx.nthu.edu.tw
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