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專利授權區

專利授權區
專利名稱(中)	金屬離子檢測方法
專利名稱(英)	Composite quantum dot, method for preparation the same and a detection method for metal ions
專利家族	中華民國：I765756 美國：US2024/0132775A1(公開號)
專利權人	國立清華大學 100%
發明人	陳學仕,陳品如
技術領域	材料化工

專利摘要(英)
This invention provides a water-induced surface repair composite quantum dotand a method for preparation the same. Said water-induced surface repair composite quantum dot comprises a quantum dot, a protection unit, and a repairunit. The quantum dot includes a first layer composed of M1A1, the protection unitis adsorbed on the quantum dot, including an amine compound, and / or an ammonium salt, the repair unit adsorbs the quantum dot and includes metal ions. In addition, the invention also provides a method for manufacturing composite quantum dots after water repair, and a method for metal ion detection by using composite quantum dots with water-induced surface repair composite quantum dot.

專利摘要(英)

This invention provides a water-induced surface repair composite quantum dotand a method for preparation the same. Said water-induced surface repair composite quantum dot comprises a quantum dot, a protection unit, and a repairunit. The quantum dot includes a first layer composed of M1A1, the protection unitis adsorbed on the quantum dot, including an amine compound, and / or an ammonium salt, the repair unit adsorbs the quantum dot and includes metal ions. In addition, the invention also provides a method for manufacturing composite quantum dots after water repair, and a method for metal ion detection by using composite quantum dots with water-induced surface repair composite quantum dot.

聯絡資訊
承辦人姓名	楊美茹
承辦人電話	03-5715131 #62305
承辦人Email	mjyang2@mx.nthu.edu.tw