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專利授權區
專利名稱(中)	材料電磁特性量測裝置以及其量測方法
專利名稱(英)	Measuring apparatus for electromagnetic property of material and measuring method thereof
專利家族	中華民國：I607227 美國：US10,353,022B2
專利權人	國立清華大學 100%
發明人	趙賢文,翁唯軒,陳彥任,張存續
技術領域	材料化工,光電光學,電子電機

專利摘要(中)
A measuring apparatus for electromagnetic property of material includes a chamber and a specified shielding piece. The chamber has a cavity inside and the chamber has an electromagnetic wave access terminal to connect to the cavity, used to receive an input electromagnetic wave and output a reflective electromagnetic wave. The specified shielding piece is disposed inside the cavity with respect to the electromagnetic wave access terminal, used to produce a region in side the cavity. The region is dominated by magnetic field and is used to adapt an object to be measured.

專利摘要(中)

A measuring apparatus for electromagnetic property of material includes a chamber and a specified shielding piece. The chamber has a cavity inside and the chamber has an electromagnetic wave access terminal to connect to the cavity, used to receive an input electromagnetic wave and output a reflective electromagnetic wave. The specified shielding piece is disposed inside the cavity with respect to the electromagnetic wave access terminal, used to produce a region in side the cavity. The region is dominated by magnetic field and is used to adapt an object to be measured.

聯絡資訊
承辦人姓名	周家鳳
承辦人電話	03-5715131 #34576
承辦人Email	cf.chou@mx.nthu.edu.tw