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專利授權區
專利名稱(中)	拉曼檢測晶片、其製造方法及運用該拉曼檢測晶片之拉曼光譜檢測系統
專利名稱(英)	RAMAN DETECTING CHIP, METHOD OF FABRICATING THE SAME AND RAMAN SPETROSCOPY DETECTING SYSTEM USING SUCH RAMAN DETECTING CHIP
專利家族	中華民國：I800366
專利權人	國立清華大學 100.00%
發明人	嚴大任,林韋丞,李煥晶
技術領域	材料化工,光電光學

專利摘要(中)
一種拉曼檢測晶片、其製造方法及運用該拉曼檢測晶片之拉曼光譜檢測系統。本發明之拉曼檢測晶片包含基材、複數根奈米線以及複數個三維樹枝狀奈米金屬結構。基材具有凹陷。凹陷具有圓形開口以及圓形底面。複數根奈米線係形成於圓形底面上且向上延伸。複數個三維樹枝狀奈米金屬結構係形成於複數根奈米線之複數個頂部上且延伸至圓形開口之外。

專利摘要(中)

一種拉曼檢測晶片、其製造方法及運用該拉曼檢測晶片之拉曼光譜檢測系統。本發明之拉曼檢測晶片包含基材、複數根奈米線以及複數個三維樹枝狀奈米金屬結構。基材具有凹陷。凹陷具有圓形開口以及圓形底面。複數根奈米線係形成於圓形底面上且向上延伸。複數個三維樹枝狀奈米金屬結構係形成於複數根奈米線之複數個頂部上且延伸至圓形開口之外。

專利摘要(英)
A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system. The Raman detecting chip according to the invention includes a substrate, a plurality of nano-wires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has an access. The access has a circular opening and a circular bottom surface. The plurality of nona-wires are formed on the circular bottom surface and protrude upward. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

專利摘要(英)

A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system. The Raman detecting chip according to the invention includes a substrate, a plurality of nano-wires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has an access. The access has a circular opening and a circular bottom surface. The plurality of nona-wires are formed on the circular bottom surface and protrude upward. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

聯絡資訊
承辦人姓名	楊美茹
承辦人電話	03-5715131 #62305
承辦人Email	mjyang2@mx.nthu.edu.tw