專利授權區 | |
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專利名稱(英) | DETECTION USING SEMICONDUCTOR DETECTOR |
專利家族 |
中華民國:I782474 大陸:CN113539873A(公開號) 美國:2021-0407764(公開號) |
專利權人 | 國立清華大學 66.67% ,台灣積體電路製造股份有限公司 33.33% |
發明人 | 金雅琴,林崇榮,林本堅,王建評,王紹華,張俊霖,陳立銳 |
技術領域 | 電子電機 |
專利摘要(英) |
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A method includes applying a first voltage to a source of a first transistor of a detector unit of a semiconductor detector in a test wafer and applying a second voltage to a gate of the first transistor and a drain of a second transistor of the detector unit. The first transistor is coupled to the second transistor in series, and the first voltage is higher than the second voltage. A pre-exposure reading operation is performed to the detector unit. Light of an exposure apparatus is illuminated to a gate of the second transistor after applying the first and second voltages. A post-exposure reading operation is performed to the detector unit. Data of the pre-exposure reading operation is compared with the post-exposure reading operation. An intensity of the light is adjusted based on the compared data of the pre-exposure reading operation and the post-exposure reading operation. |
聯絡資訊 | |
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承辦人姓名 | 李曉琪 |
承辦人電話 | 03-5715131 #31061 |
承辦人Email | hsiaochi@mx.nthu.edu.tw |